Service description
TEM: Spectrum-Imaging
The Spectrum Imaging analysis is performed using the scanning mode (STEM) of the TEM microscope to get data matrices that contain spectral data in addition to spatial information from the Z-contrast images obtained with the annular detector. The microscope Tecnai F30 is equipped with a Gatan Imaging Filter (GIF Quantum SE) which allows the acquisition of electron energy loss spectra (EELS) and with a Silicon Drift Detector X-Max 80T (Oxford Instruments) to analyze the X-ray emission by energy dispersion (EDX). The HAADF, EELS and EDX signals can be recorded simultaneously or independently through the DigiScan software.
Options and prices chart
| Options |
Unit |
Public Sector |
Other customers |
| General |
euro / hora |
155.15 € |
178.42 € |
| General |
euro / hora |
159.96 € |
183.95 € |