Service description
- Scanning Electron Microscope FEI QUANTA 200 operating with three modes vacuum (high vacuum, low vacuum and environmental mode) detectors secondary and backscattered electrons for all modes of vacuum, the microscope has an integrated analysis system OXFORD INSTRUMENTS Analytical-Inca with two X-ray detectors that can be used simultaneously and alternatively one EDS (Energy Dispersive) and another WDS (Wavelength Dispersive).
It has a peltier 0 ° C to 20 ° C which allows varying the conditions of temperature and pressure of the sample within the chamber.
- Scanning Electron Microscope FEI INSPECT detector secondary electron and backscattered operates under high vacuum and low vacuum mode. The microscope has an integrated analysis system OXFORD INSTRUMENTS analytical-INCA. This microscope has a cathodoluminescence detector with liquid cooling system with N2 and spectral extension until Infrared Model GATAN Mono CL3.
When working in eviromental mode and low vacuum, the sample retains its natural state and is not prepared and modifies the sample for study.
Options and prices chart
Options |
Unit |
Public Sector |
Other customers |
General |
euro / hora |
115.88 € |
126.91 € |