Scanning Electron Microscopy (SEM) : Field Emission - FEGSEM | Consejo Superior de Investigaciones Científicas

Service data

Support unit: SERVICIO DE MICROCOPÍA ELECTRÓNICA Y ÓPTICA
Institute: INSTITUTO DE CIENCIAS DEL MAR
Locality: Barcelona (Barcelona)
Service's web: http://www.cmima.csic.es/serveis/micro/

Service's description

Equipos: dos microscopios electrónicos de barrido, uno de Emisión de Campo (FESEM) HITACHI SU8600, y otro de presión variable (VPSEM), HITACHI S-3500N. El SU8600, está equipado con los siguientes detectores: 2 de electrones secundarios, dos de retrodispersados y dos de rayos X por dispersión de energías (EDS, BRUKER QUANTAX XFlash 7) para la realización de microanálisis. Un detector STEM para campo claro y campo oscuro. El S-3500N dispone de un detector de secundarios, uno de retrodispersados, de un espectrómetro EDS (BRUKER QUANTAX 200 y detector XFlash 6/30) y de un crio-SEM (QUORUM PP3000T) para el estudio de muestras crio-fijadas. Preparación de muestras: secado por punto crítico (LEICA EM CPD300), metalización por sputtering con cromo, iridio u oro y evaporación de carbón (QUORUM Q150T Plus). 8 Microscopios Ópticos (OLYMPUS- BX40F4, OLYMPUS-BX61, LEITZ-DM IL, 2 NIKON-DIAPHOT-200, ZEISS-AXIOVERT, LEICA-DM IRB S8F, ZEISS-Colibri), la mayoría equipados con epifluorescencia.

Service description

The field emission scanning electron microscope allows te obtention of high resolution images, with a high depth of field. All the signals that originate in the sample (secondary electrons, backscattered electrons, X-rays, etc.) can be used to obtain information about the nature of the sample. Therefore, it is very useful for carrying out morphological, topographical and compositional studies. At the ICM Electron Microscopy Service we have extensive experience in the study of marine microorganisms, including the preparation of said samples. We also have experience in the studiy of structures and tissues of both marine and terrestrial organisms, including botanical samples, sediments and different types of materials. The characteristics of the Hitachi SU8600, a FE-SEM with 0.6 nm resolution, allows the study of samples at very low energies, allowing the observation of certain samples without metallization. It is equipped with secondary and backscattered electron detectors, in the column and in the chamber, and the visualization of all the signals can be done simultaneously. Likewise, chemical analyzes can be carried out on the samples, identifying the X-ray signals coming from their surface. The equipment has two X-ray energy dispersion detectors (EDS Bruker XFlash 7) of 123 eV resolution, allowing the qualitative and quantitative analysis of the chemical elements present in the samples.

Options and prices chart
Options	Unit	Public Sector	Other customers
HORAS DE FEGSEM	€ / hora	68.89 €	85.3 €
HORAS DE FESEM	hora	57.65 €	71.38 €

Service description

The scanning electron microscopy service, equipped with a QUANTA FEI 200 FEG-ESEM offers a powerful imaging tool for both, routine and advanced inspection of materials. The service is intended to offer high resolution facilities (1.2nm @30kV) with a field emission gun, specially suited for the morphological characterization of nanocrystals, nanostructured materials and surfaces. Image contrast proportional to the atomic number is also available with high lateral resolution (2.5 nm @30kV) using an electron backscattered detector. The instrument can be used in high vacuum mode, low-vacuum mode (the chamber pressure is monitored by water vapour injection), and environmental SEM mode (ESEM). This makes possible to study samples in pressures up to 5 Torr. The resolution is kept high at all conditions: 1.2 nm and 1.5 nm at 30kV in the high and low vacuum modes, respectively. The capability to vary the chamber pressure is specially suited for the observation of uncoated non-conducting materials. The microscope also features an EDS detector designed for light elements starting from Be, with an energy resolution of 132 eV. This tool enables the chemical analysis with a high lateral resolution (point analyses and elemental mapping), as required for the characterization of complex multicomponent nanostructured materials. The service includes electron beam lithography, used in many research activities at ICMAB like development of organic devices, the fabrication of substrate templates designed for defect engineering in thin epitaxial superconducting films, investigation of surface self-organization phenomena, and the fabrication of magnetoelectronic devices. Lithography and nano-lithography can be performed by a RAITH e-beam. An environmental SEM, enabling characterization of non-conducting without a conductive, and is equipped with EDS (light element) and electron-beam.

Options and prices chart
Options	Unit	Public Sector	Other customers
General	€ / hora	109.33 €	135.86 €
FEGSEM_autoservicio	€/hora	119.17 €	148.09 €
FEGSEM_con soporte tecnico	€/hora	119.17 €	148.09 €

Service description

The field emission scanning electron microscope (FESEM) is an instrument that, like the SEM, is capable of offering a wide variety of information from the surface of the sample, but with higher resolution and with a much wider energy range. elderly. The operation is the same as that of a conventional SEM; A beam of electrons is swept over the surface of the sample while the information that interests us is displayed on a monitor based on the available detectors. The biggest difference between a FESEM and an SEM lies in the electron generation system. The FESEM uses as an electron source a field emission gun that provides highly focused high and low energy electron beams, which significantly improves spatial resolution and allows working at very low potentials (0.02 - 5 kV); This helps minimize the charging effect on non-conductive specimens and prevent damage to samples sensitive to the electron beam. Another very notable feature of the FESEM is the use of detectors inside the lens (in lens). These detectors are optimized to work at high resolution and very low acceleration potential, so they are essential to obtain maximum performance from the equipment.

Options and prices chart
Options	Unit	Public Sector	Other customers
HORAS DE FEGSEM	€ / hora	188.55 €	206.51 €
HORAS DE FEGSEM	€ / hora	201.34 €	220.51 €

Support unit	Support unit Information	Selected service	Other services
SERVICIO DE MICROCOPÍA ELECTRÓNICA Y ÓPTICA ICM - Barcelona
Microscopia electronica ICMAB - Cerdanyola del Vallès
SERVICIO DE TÉCNICAS NO DESTRUCTIVAS MNCN - Madrid